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CY3438 Pt-plated Silicon Wafer (Pt Coated SiO2/Si Substrate)

Catalog No. CY3438
Compositions Pt, Ti, SiO2, Si
Size 4” Dia.
Film Thickness SiO2 500nm (N100), Pt 150mm, Ti 20nm

Pt Coated SiO2/Si Substrate can be used in the nano field, scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscope ranging. Stanford Advanced Materials (SAM) has rich experience in manufacturing and supplying high-quality Optical Products.

Related products: Aluminum Film on Silicon Wafer, Au/Ti Coated SiO2/Si Substrate, Au/Cr Coated SiO2/Si Substrate, Ag-plated Silicon Wafer

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