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  • CY3439 Ag-plated Silicon Wafer (Ag/Cr Coated SiO2/Si Substrate)

    • CY3439 Ag-plated Silicon Wafer (Ag/Cr Coated SiO2/Si Substrate)

    Catalog No. CY3439
    Compositions Ag, Cr, SiO2, Si
    Coating thickness Cr 2-7nm Ag 50nm
    Size 4”, 50mm, 100mm Dia, or customized
    Thickness 0.525mm, 0.279mm
    Polishing One side polished

    Ag/Cr Coated SiO2/Si Substrate can be used in the nano field, scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscope ranging. Stanford Advanced Materials (SAM) has rich experience in manufacturing and supplying high-quality Optical Products.

    Related products: Aluminum Film on Silicon Wafer, Au/Ti Coated SiO2/Si Substrate, Au/Cr Coated SiO2/Si Substrate, Pt Coated SiO2Si Substrate

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