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| Catalog No. | CY3437 |
| Compositions | Au, Cr, SiO2, Si |
| Resistivity | <0.005 ohm.cm |
| Substrate Size | 4" diameter +/- 0.5 mm x 0.5 mm |
| Polishing | One side polished |
| Surface roughness | < 10 A RMS |
Au/Cr Coated SiO2/Si Substrate can be used in the nano field, scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscope ranging. Stanford Advanced Materials (SAM) has rich experience in manufacturing and supplying high-quality Optical Products.
Related products: Aluminum Film on Silicon Wafer, Au/Ti Coated SiO2/Si Substrate, Pt Coated SiO2/Si Substrate, Ag-plated Silicon Wafer
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