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CY3452 Ti coated SiO2/Si Substrate

Catalog No. CY3452
Compositions Ti, SiO2, Si
Size 2, 4, 6, 8”
Film Thickness Ti: 15-100nm, or customized

Ti coated SiO2/Si Substrate can be used in the nano field, scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscope ranging. Stanford Advanced Materials (SAM) has rich experience in manufacturing and supplying high-quality Optical Products.

Related products: Cu coated SiO2/Si Substrate, Ni Coated SiO2/Si Substrate, Gold-plated Silicon Wafer, Pt-plated Silicon Wafer, Ag-plated Silicon Wafer

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sc/1623314328-normal-ti-coated-sio2-si-substrate.jpg
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