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  • CY3451 Cu Coated Ta/SiO2 Silicon Wafer

    • CY3451 Cu Coated Ta/SiO2 Silicon Wafer

    Catalog No. CY3451
    Composition (Cubic) Cu, Ta, SiO2
    Purity ＞99.99%
    Size 2, 4, 6, 8, 12” dia 0.525mm thickness
    Orientation Cu <111>

    Cu Coated Ta/SiO2 Silicon Wafer can be used in the nano field, scanning electron microscopy (SEM), atomic force microscopy (AFM), and other scanning probe microscope ranging. Stanford Advanced Materials (SAM) has rich experience in manufacturing and supplying high-quality Optical Products.

    Related products: Ti coated SiO2/Si Substrate, Ni Coated SiO2/Si Substrate, Gold-plated Silicon Wafer, Pt-plated Silicon Wafer, Ag-plated Silicon Wafer

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